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    学术讲座(四十七):Recommended Practices for Measuring Oxygen Electrocatalysts

    2019-09-10

    主讲人: Zhichuan J. Xu (徐梽川)

    时间: 2019911日下午3:00

    地点: 深圳大学西丽校区B1-420会议室

    报告人简介:

    Zhichuanis an associate professor in School of Materials Science and Engineering,Nanyang Technological University. He received his PhD degree inElectroanalytical Chemistry at 2008 and B.S. degree in Chemistry at 2002 fromLanzhou University, China. His PhD training was received in Lanzhou University(2002-2004), Institute of Physics, CAS (2004-2005), and Brown University(2005-2007). Since 2007, he worked in State University of New York atBinghamton as a Research Associate and from 2009 he worked in MassachusettsInstitute of Technology as a Postdoctoral Researcher. Dr. Xu is member ofInternational Society of Electrochemistry (ISE), The Electrochemistry Society(ECS), and American Association for the Advancement of Science (AAAS). He wasawarded Fellow of Royal Society of Chemistry (FRSC) in Nov. 2017. He served asa guest editor for the special issue ICEI2016 of Electrochimica Acta and anassociate editor for Nano-Micro Letters. He is also the development editor forCurrent Opinion in Electrochemistry and the vice president of ECS SingaporeSection. Dr Xu is 2018 Highly Cited Researcher by Clarivate Analytics, Web ofScience.  

     

    报告摘要:

    Exploringnew oxygen electrocatalysts for oxygen reduction and evolution reactions (ORRand OER) has been one of hottest topics in recent years. This tutorialpresentation will introduce recommended practices for measuring the oxygenelectrocatalysts. The objective of this presentation is to help new studentsand learners to master the basic knowledge and lab skills for reliableelectrochemical measurements. Some simple demonstration will be given alongwith the introduction. The skills to be introduced includes 1) electrodepreparation, 2) electrochemical cell set-up preparation, 3) potentialconversion principles, 4) measurement practices for ORR and OER, 5) dataanalysis, 6) mass-transport correction, 7) iR-drop correction, 8) capacitancecorrection, 9) data storage and documentation, and 10) some details needattention during the measurement.

     

     

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